Subpart D. Subpart D—Maintenance, Inspection, and Testing
Maintenance Standards
- SECTION § 234.201 - Location of plans.
- SECTION § 234.203 - Control circuits.
- SECTION § 234.205 - Operating characteristics of warning system apparatus.
- SECTION § 234.207 - Adjustment, repair, or replacement of component.
- SECTION § 234.209 - Interference with normal functioning of system.
- SECTION § 234.211 - Security of warning system apparatus.
- SECTION § 234.213 - Grounds.
- SECTION § 234.215 - Standby power system.
- SECTION § 234.217 - Flashing light units.
- SECTION § 234.219 - Gate arm lights and light cable.
- SECTION § 234.221 - Lamp voltage.
- SECTION § 234.223 -
- SECTION § 234.225 - Activation of warning system.
- SECTION § 234.227 - Train detection apparatus.
- SECTION § 234.229 - Shunting sensitivity.
- SECTION § 234.231 - Fouling wires.
- SECTION § 234.233 - Rail joints.
- SECTION § 234.235 - Insulated rail joints.
- SECTION § 234.237 - Reverse switch cut-out circuit.
- SECTION § 234.239 - Tagging of wires and interference of wires or tags with signal apparatus.
- SECTION § 234.241 - Protection of insulated wire; splice in underground wire.
- SECTION § 234.243 - Wire on pole line and aerial cable.
- SECTION § 234.245 - Signs.
Inspections and Tests
- SECTION § 234.247 - Purpose of inspections and tests; removal from service of relay or device failing to meet test requirements.
- SECTION § 234.249 - Ground tests.
- SECTION § 234.251 - Standby power.
- SECTION § 234.253 - Flashing light units and lamp voltage.
- SECTION § 234.255 - Gate arm and gate mechanism.
- SECTION § 234.257 - Warning system operation.
- SECTION § 234.259 - Warning time.
- SECTION § 234.261 - Highway traffic signal pre-emption.
- SECTION § 234.263 - Relays.
- SECTION § 234.265 - Timing relays and timing devices.
- SECTION § 234.267 - Insulation resistance tests, wires in trunking and cables.
- SECTION § 234.269 - Cut-out circuits.
- SECTION § 234.271 - Insulated rail joints, bond wires, and track connections.
- SECTION § 234.273 - Results of inspections and tests.
Requirements for Processor-Based Systems