- Table 12 to Subpart WWWW of Part 63—Data Requirements for New and Existing Continuous Lamination Lines and Continuous Casting Lines Complying With a Lbs/Ton Organic HAP Emissions Limit on a Per Line Basis
As required in § 63.5865(b), in order to comply with a lbs/ton organic HAP emissions limit for continuous lamination lines and continuous casting lines you must determine the data in the following table:
| For each line where the wet- out area . . . | And the oven . . . | You must determine . . . | 1. Is uncontrolled | a. Is uncontrolled | i. Annual uncontrolled wet-out area organic HAP emissions,
ii. Annual uncontrolled oven organic HAP emissions, and iii. Annual neat resin plus and neat gel coat plus applied. | 2. Has an enclosure that is not a PTE and the captured organic HAP emissions are controlled by an add-on control device | a. Is uncontrolled | i. Annual uncontrolled wet-out area organic HAP emissions,
ii. Annual controlled wet-out area organic HAP emissions, iii. Annual uncontrolled oven organic HAP emissions, | iv. The capture efficiency of the wet-out area enclosure,
v. The destruction efficiency of the add-on control device, and vi. The amount of neat resin plus and neat gel coat plus applied. | 3. Has an enclosure that is a PTE, and the captured organic HAP emissions are controlled by an add-on control device | a. Is uncontrolled | i. Annual uncontrolled wet-out area organic HAP emissions,
ii. Annual controlled wet-out area organic HAP emissions, iii. Annual uncontrolled oven organic HAP emissions, | iv. That the wet-out area enclosure meets the requirements of EPA Method 204 of appendix M to 40 CFR part 51 for a PTE,
v. The destruction efficiency of the add-on control device, and vi. The amount of neat resin plus and neat gel coat plus applied. | 4. Is uncontrolled | a. Is controlled by an add-on control device | i. Annual uncontrolled wet-out area organic HAP emissions,
ii. Annual uncontrolled oven organic HAP emissions, iii. Annual controlled oven organic HAP emissions, | iv. The capture efficiency of the oven,
v. The destruction efficiency of the add-on control device, and vi. The amount of neat resin plus and neat gel coat plus applied. | 5. Has an enclosure that is not a PTE and the captured organic HAP emissions are controlled by an add-on control device | a. Is controlled by an add-on control device | i. Annual uncontrolled wet-out area organic HAP emissions,
ii. Annual controlled wet-out area organic HAP emissions, iii. Annual uncontrolled oven organic HAP emissions, | iv. Annual controlled oven organic HAP emissions,
v. The capture efficiency of the wet-out area enclosure, vi. The capture efficiency of the oven, | vii. The destruction efficiency of the add-on control device, and
viii. The amount of neat resin plus and neat gel coat plus applied. | 6. Has an enclosure that is a PTE, and the captured organic HAP emissions are controlled by add-on control device | a. Is controlled by an add-on control device | i. That the wet-out area enclosure meets the requirements of EPA Method 204 of appendix M to 40 CFR part 51 for a PTE,
ii. The capture efficiency of the oven, iii. Inlet organic HAP emissions to the an add-on control device, and | iv. Outlet organic HAP emissions from the add-on control device. |
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